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Park SYSTEMS Research AFM XE-NSOM |
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Park SYSTEMS XE-NSOM
A Complete AFM System for diverse optical applications
The XE-NSOM is specially designed and tailored for advanced optical measurements including Near-field Scanning Optical Microscopy (NSOM) and Raman Spectrometry. The XE-NSOM offers a complete AFM system setup with unprecedented adaptability for these optical experiments. The high-performance Z-servo scanner of the XE-NSOM supports True Non-Contact AFM and utilizes cantilever-based closed-loop feedback technology. - Seamless integration of AFM and optical measurements
- Upgradeable modular design supports AFM, NSOM and Raman Spectroscopy
- Versatility supporting various reflection/transmission modes
- Optical head design provides convenient experimental access to the sample
- Easy alignment of optical axes to the photon detection system
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Features - High Resolution Digital CCD Camera with Digital Zoom
Direct on-axis resolution digital CCD with CCD zoom capability allows high clarity and high resolution image quality regardless of panning. - Dovetail Lock Head Mount
The AFM head, which includes the Z-scanner, is easily inserted or removed by sliding it along a dovetail rail and locking it into place with a convenient turn of two thumb locks. - 12μm Flexure-Guided High Force Z-scanner
For the Z-scanner, a high force multi-stack piezo enables a high speed 1-dimensional actuator, which moves the probe in the vertical direction. - Optical Head Design Facilitates Sample Access
The XE-NSOM’s optical head, designed to provide open access to the sample (58 degree cone angle), supports transmission or reflection mode for Raman, Near-Field Fluorescence and NSOM. - Super Luminescence Diode (SLD) Head
The low coherency of the Super Luminescence Diode (SLD) enables accurate imaging of highly reflective surfaces and precise measurements for pN Force-distance spectroscopy. An additional advantage of the SLD Head is its compatibility with experiments that utilize light in the visible region of the spectrum. - EZ Snap Probe Tip Exchange
Probe tip exchange is just a snap with a pre-aligned kinematic chip mounts that guarantee the position of the probe tip without requiring special tools or head removal. - 100μm × 100μm Flexure-based Closed-loop XY-Scanner
The single module parallel-kinematics XY-scanner has low inertia and minimal runout, providing the best orthogonality, high responsiveness, and axis-independent performance. With minimal coupling, hardware closed-loop position control allows for the absolute scaling of AFM measurements, attining 1.5 nm closed-loop lateral resolution. - Direct On-Axis NSOM Laser Feed
The Direct On-Axis NSOM Laser Feed maintains a stable and fixed NSOM laser path, supporting easy laser alignment with respect to the cantilever. - On-Axis CCD Camera & Light Source
A high resolution on-axis optical view of the sample and probe is conveniently displayed. - Photon Detector Counter Module
Two channels with 16bit counters support a maximum pulse width of 10 ns.
Optics Specification - Supported Modes
Transmission, Reflection, Fluorescence, and illumination/Collection mode
Confocal Raman Spectroscopy
Collection, Polarization - Lasers
405 nm (diode laser)
488 nm (Ar laser)
Changeable by customer’s request
Delivered to the sample by 3-branch tube
* Path effency: 30% transmission
100x collection lens (N.A: 0.8)
Laser coupling by optical fiber (single mode)
Total transmission rate: 405nm~39.33% - Resolution
NSOM resolution:
100 nm (depending on the aperture size of the cantilever used)
Topography resolution:
1 nm (typical) in horizontal, 0.1 nm (typical) in vertical direction
* Resolution depending on the cantilever used - Probes
Apertured cantilever
* Aperture size: 30, 50, 100 nm (selectable by user)
Apertureless cantilever - Photon Detection
Detector type: PMT, APD (selectable by user)
Spectral range: 185 nm ~ 900 nm (depending on the detector used)
Photon counter: 2 channels of 216 (16 bit) counters
* Maximum pulse width: 10 nsec
* Time sonstant: 1μsec ~ 214μsec - XY-scanner
Scan size: 100μm × 100μm (10μm × 10μm in low voltage mode)
Resolution
* Open-loop: ＜ 0.04 nm
* Closed-loop: 1.5 nm
Closed-loop scan for precise position control - Z-scanner
Guided flexture stage
Scan size: 12μm (1.7μm in lowvoltage mode)
Resolution: 0.05 nm (0.01 nm in low voltage mode)
Resoluion of closed-loop height sensor: 0. 2nm - Stage
XY stage: 4 mm × 4mm, manual
Z stage: 27.5 mm, motorized
* 0.08 μm resolution, 2 μm repeatability
Optical focus stage: 20 mm, motorized - Sample Limitation
100 mm × 100mm, 20 mm thick
500g - Optical Display
On-axis optical view of the sample and probe
Field of view: 480μm × 360μm (Objective lens: 10x)
Magnification on screen: 780x (Objective lens: 10x)
Optical resolution: 1μm
Mechanical Specification - XE Optical Head for NSOM Configuration
Wide optical access to the sample from the side: 58° (cone-angle)
Sample-distance feedback control method: Cantilever deflection
Zero scan noise in Z: 0.02 nm (typical)
* Better performance than a tuning fork (0.5 nm, typical)
Detection of cantilever deflection: Super Luminescent Diode (SLD, 830 nm)
* Low coherent light to eliminate interface noise
* Avoids wavelength of other applications using visual optics region
Automated cantilever approach to the sample surface
Electronics
Closed-loop feedback for X and Y axes
Maximum image size: 4096 × 4096 pixels
Maximum data channels: 16 images simultaneously
DSP: 600 MHz, 4800 MIPS processing power
ADC: 16 channels of 16 bit at 500 kHz
DAC: 16 channels of 16 bit at 500 kHz
Signal access: On-board 3 inputs and 1 output
Synchronous signals for simultaneous external data acquisition
* End-of-pixel, end-of-line, and end-of-frame TTL signals
External Signal Access Module for access to low-level system signals (optional)
Software - XEP
Dedicated system control and acquisition software
Adjusting feedback gain, set point, drive frequency/amplitude/phase in real time
Scrip-level control through external program such as LabVIEW (optional) - XEI
AFM data analysis software (running on Windows, MacOS X, and Linux) - XYZ Position Control UI for the Collecting Lens
The optical signal from the sample excited by the laser is collected by the collecting lens in the NSOM Detectin Box. To maximize the signal intensity, the position of the collecting lens is adjusted conveniently using the 3-axis control UI for the collecting lens.
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