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Park SYSTEMS Research AFM XE-70 |
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Park SYSTEMS Research AFM XE-70
Affordable, Research-Grade AFM with Flexible Sample Handling
An economic extension of the XE-100, the XE-70 is Park Systems’ new AFM solution for budget conscious customers. Having a compact mechanical design, the XE-70 continues the innovative technology of the XE-series that sets it apart from conventional AFM. The XE-70 shares the same modes, options, and electronics as well as all other systems in the XE product line. - Compact mechanical design
- 50 μm × 50 μm XY scan range
- 12 μm Z scan range
- Manual optics stage
- Complete new system with XE electronics
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Features - Dovetail Lock Head Mount
The AFM head, which includes the Z-scanner, is easily inserted or removed by sloding it along a dovetail rail and locking it into place with a convenient turn of two thumb locks.
- Flexure-guided High Force Z-scanner
For the Z-scanner, a high force multi-stack piezo enables a high speed 1-dimensional actuator, which moves the probe in the vertiacal direction.
- EZ Snap Probe Tip Exchange
Probe tip exchange is just a snap with an advanced pre-aligned kinematic chip mount that guarantees the same position of a probe tip without the need of tools or head removal.
- Flexture-based Closed-loop XY-scanner
This single module parallel-kinematics XY-scanner has low inertia and minimal runout, providing the best orthogonality, high responsiveness, and axis-independent performance. With minimal coupling, hardware closed-loop position control allows for the absolute scaling of AFM measyrements, attaining 6 Å closed loop lateral resolution.
- Manual Optics Stage
The focus mechanism for the on-axis optics is adjusted manually as an optical microscope is.
- Manual XY Sample Stage
The travel range of the XY sample stage is 25 × 25 mm.
The maximum sample size one can place on the stage is 100 × 100 × 25 mm.
Options - Head
- 25 μm Z Scanner Head
- Optical Head
- Hysitron TriboScope Adapter Head
- Liquid Cell
- Open Liquid Cell
- Dynamic Liquid Cell
- EC (Electro-Chemical) Cell
- Probe Hand
- Clip Type Probe Hand
- Shield Liquid Probe Hand
- Glass Liquid Probe Hand
- STM Probe Hand
- SCM Probe Hand
- Enviromental Control
- Heating & Cooling Stage
- Heating Stage for High Temperature Control
- Environmental Chamber (glove box)
- Humidity Control Symtem
- Water Pump & Temperature Controller
- Accessories
- SAM (Signal Access Module)
- MFG (Magnetic Field Generator)
- Chip Carriers
- Asoustic Enclosure
- Asoustic Foam Box
- Standard Asoustic Enclosure
- Enhanced Acoustic Enclosure with Steel Frames
Specifications - Scanner
Decoupled XY and Z-scanner
Single module flexture XY-scanner with closed-loop control
Height sensing of Z-scanner
Scan range of XY-scanner : 5 μm, 50 μm, or 100μm
Working distance of Z-scanner : 12 μm or 25 μm
- Stage
Working range of XY stage : 25 mm × 25 mm, manual precision movement
Working range of Z stage : 27.5 mm, motorized movement
Sample size : Up to 80 mm × 80 mm, 20 mm thick, and up to 500 g
- Head
Detection of cantilever deflection
-Laser Diode (option): 650 nm
-Super Luminescent Diode (standard): 835 nm with low coherency
Optical Access Availability Option
-Accessible solid angle : 58° of cone angle
Raman spectroscopy on localized region(Raman AFM)
- Optics
On-axis vision of sample surface and antilever
Focus range : 20 mm, manually adjustable like optical microscopes
Magnification : 780x (optional 160x, 390x, or 1500x)
Field of view : 480μm × 360μm
Optical resolution : 1μm
- Electronics
High performance : 600 MHz with 4800 MIPS
Maximum image size : 16 data channels of 4096 × 4096 pixels
Signal inputs : 20 channels of 16 bit ADC at 500 kHz sampling
Signal outputs : 21 channels of 16 bit DAC at 500 kHz settling
Electric signal noise : < 10 pA (system default), < 0.1 pA (optional)
Synchronous signal : End-of-image, end-of line, and end-of-pixel TTL signals
Active Q control (optional)
Cantilever spring constant calibration (optional)
- Software
XEP
Dedicated system control and acquisition software
Adjusting feedback gain, set point, drive frequency/amplitude/phase in real time
Scrip-level control through external program such as LabVIEW (optional)
XEI
AFM data analysis software (running on Windows, MacOS X, and Linux)
- Supported Modes
True Non-Contact Mode
Contact Mode
Lateral Force Microscopy
Phase imaging of true Non-Contact, FMM, MFM, EFM, and SCM
Conductive AFM
Scanning Tunneling Microscopy
Magnetic Force Microscopy
Electric Force Microscopy
Scanning Capacitance Microscopy
Scanning Thermal Microscopy
Nanolithography
Nanoindentation
- Accessories
Electrockemistry AFM
Dynamic Liquid Cell with heating/cooling stage
Heating/Cooling sample stage
Magnetic Field Generator
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