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Scanning Electron Microscope S-3000N/H |
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Scanning Electron Microscope S-3000N/H
The S-3000N is a Variable Pressure SEM, while the S-3000H is a conventional high vacuum SEM. Both instruments use Windows®*, providing operators with a familiar graphical user interface (GUI) environment. A high-density frame memory of 1,280 x 960 pixels allows superior quality image recording and storage. Both SEMS have been designed to provide exceptional ease-of-use and expansiveness for future needs. |
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Scanning Electron Microscope S-3000N
A unique real time vacuum feedback system gives chamber vacuum stability even if the specimen outgases. The large chamber will accommodate samples up to 150mm in diameter. A solid state backscattered detector is supplied and 4.5nm resolution can be achieved in VP mode.
Scanning Electron Microscope S-3000H
The S-3000H can accommodate specimens up to 150mm in diameter, and offers a choice of specimen stages including eucentric, Cartesian, tensile and cryogenic versions for a wide range of applications. A host of automatic functions are complemented by a resolution of 3.5nm resolution.
The S-3000N and S-3000H Standard Features - True Windows® environment
- Unique Dual Bias function for exceptional performance at low voltage
- User-friendly operation similar to commercial PC software
- Interactive monitor display and mouse-operated controls
- Both knob set and mouse control of SEM parameters
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