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Scanning Electron Microscope S-3400N |
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Scanning Electron Microscope S-3400N
Newly developed S3400N with all new electron optics and vacuum system provides operators with the best tools available for obtaining the best results for a wide range of applications. Excellent low voltage performance and automated alignment features assist the operator to obtain better results. New high sensitivity Quad+1 BSE detector for optimum BSE imaging. |
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The S-3400N is a yet more user-friendly SEM through newly developed electron optics and automatic functions.
Features - Revolutionary automatic axis-aligment fucntions (Auto Beam Setting, Auto Axial Aligment, ect.)
- Even better resolution of 10nm at 3kV
- Real time, dual image display and signal mixing
- 5-axis motorized stage with high tilt (-20 ~ +90 deg.) a tall sample up to 80mm high applicable (Type 2)
- Analytical specimen chamber with optimum geometry for simultaneous accommodation with EDS, WDS and EBSD
- Saving floor space and electric power consumption due to TMP evacuation system
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