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Analytical Schottky Emission Scanning Electron Microscope S-4300SE/N |
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Analytical Schottky Emission Scanning Electron Microscope S-4300SE/N
The S-4300SE/N brings the resolution capabilities of the high brightness field-emission electron gun to variable pressure scanning electron microscopy. The wide operating pressure range of 10 - 1000 Pa allows examination of an even wider range of wet, oily or nonconductive samples. Outstanding resolution at low accelerating voltages and excellent sample handling capabilities combine performance with versatility. |
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S-4300SE/N
The S-4300SE/N is suitable for basic research and applications in nano-technologies allowing high resolution microscopy and analysis in variable pressure mode.
Features - Large sample chamber with variable pressure 10 ~ 1,000 Pa
- Unique secondary electron detector (ESED)* is available as an option for VP (variable pressure) mode
- High magnification work is available with water-containing (wet) samples which have been difficult with conventional SEMs
- High resolution microscopy of electronic materials without sample-coating. The VP (variable pressure) mode is useful for microscopy of charge-sensitive samples.
* ESED stands for Environmental Secondary Electron Detector |
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