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Analytical Schottky Emission Scanning Electron Microscope S-4300SE |
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Analytical Schottky Emission Scanning Electron Microscope S-4300SE
This versatile microscope with a thermal FE source has been designed for applications in the semiconductor industry, materials and biological sciences where excellent beam stability, and high resolution are essential. There is a choice of specimen stages and optional accessories include electron beam lithography, cathodoluminescence, EBSP and EDX. |
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The S-4300SE is a high resolution Analytical Schottky Emission Scanning Electron Microscope (SESEM) that suits the needs of users in material and life sciences as well as semiconductor disciplines.
It has been designed for applications that require
1) high source brightness,
2) high probe current,
3) both short and long-term beam stability, and
4) high resolution imaging.
The S-4300SE can be fully integrated with various optional accessories including Cathode Luminescence (CL), Electron Backscattered Diffraction Pattern (EBSP), Energy Dispersive X-ray Spectrometer (EDX) and Electron Beam Lithography (EB). |
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