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Cold Field Emission Scanning Electron Microscope S-4700 |
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Cold Field Emission Scanning Electron Microscope S-4700
The S-4700 is an extremely sophisticated FE-SEM which offers pre-programmed operating modes to allow the user to switch from high resolution conditions to microanalysis conditions at the click of the mouse with no change of objective aperture. Outstanding low kV performance produces a resolution of 2.5nm at 1kV at the microanalysis and specimen exchange position. |
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Features - High resolution at low accelerating voltagel
2.1 nm resolution guaranteed at 1 kV - Routine microscopy at a long
working distance of 12 mm - Allowing sample exchange via airlock without repositioning
- High resolution of 1.5 nm at 15 kV
- Sample tilt of 45 degrees without change of working distance
- High X-ray take-off angle of 30 degrees with the sample normal to the beam
- Convenient and useful beam shift of ±15 microns
- Integrated electron detector for both SE and BSE with signal manipulation design
- Operators can choose SE, BSE or both of them for the best imaging of their samples
- Complete column set-up through the computer
- Without having to change the objective aperture, the operator simply switches between ultra high resolution mode and analysis mode through the click of a mouse
- Unique objective lens design permits simultaneous use of YAG type BSE and EDX detector
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