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Ultra-high Resolution Scanning Electron Microscope S-5500 |
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Ultra-high Resolution Scanning Electron Microscope S-5500
Like no other SEM in the world...
Ultra-high resolution microscopy places special demands on the equipment used to capture new information and reveal the secrets of the Nano-world. The new S-5500 meets these with proven technology, combining high resolution and easy, reliable operation. The S-5500 boasts a host of features and details, all designed to make high resolution microscopy and analysis that much easier. |
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Technical Information - 0.4 nm at 30kV / 1.6 nm at 1 kV
- Hitachi’s unique variable super E×B*3 sigal mode allows operator to optimize secondary and backscatter signal content of the image
- New BF/DF Duo-STEM detector allows simultaneous display of BF and DF images. Variable detection angle in DF STEM mode (option)
- Electron optical design allows EDS Analysis an Imaging without changing specimen position
- EDS solid angle of 0.15 steradians or better at 20 degrees
- FIB compatible holders for seamless imaging of targeted preparation sites.
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