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Analytical UHR Schottky Emission Scanning Electron Microscope SU-70 |
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Analytical UHR Schottky Emission Scanning Electron Microscope SU-70
Model SU-70 is a new concept SEM incorporating field proven Hitachi’s semi-in-lens technology for ultra high resolution, and Schottky electron gun. It features not only ultra high resolution (1.0 nm/15kV, 1.6nm*/l kV), but also observation of charge-up reduced image, compositional contrast image, ultra-low accelerating voltage image*, benefiting from highly-reputed Super ExB function. The Schottky electron gun enables to deal with wide variety of analytical work (EDX*, WDX*, EBSP*, etc) thanks to its 100 nA probe current. (*option) |
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The spectacular SU-70 - Features
- Schottky Field Emission Source
- UHR Ultra-High-Resolution 1.0 nm / 15 kV (1.6 nm / 1 kV)
- Hitachi´s unrivaled Super EXB Filter - Sophisticated SE/BSE-signal-detection
- FieldFreeMode (FF mode) - observing magnetic samples and distortion-free EBSD-analysis
- Breath-taking Probe Current far beyond 100 nA
- Versatile analytic-chamber for multiple, simultaneous analysis
- Highest Beam Stability
Four years after the successful introducing of the Hitachi´s S-4800 CFE (ColdFieldEmission) and the analytical S-4300 SE (SchottkyEmission) into the market, we are proud to present our NEW versatile solution for analytical purposes in combination with High-resolution-capabilities.
The new SU-70 delivers breath-taking probe currents up to 100nA and an impressing Low kV-resolution for upcoming conceptual formulations.
Get convinced by this performance regarding to our Hitachi 'semi-in-lens'-concept and the Field-Emission-Schottky-Gun. Take advantage of this uncompromissing ScanningElectronMicroscope (SEM).
The SU-70 invites you to do the next steps in the nanoworld! |
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